Spectroscopic Ellipsometry Page

Can detect films thinner than a single nanometer.

The versatility of SE makes it indispensable across multiple high-tech industries: Spectroscopic Ellipsometry

As materials continue to shrink in size while growing in complexity, spectroscopic ellipsometry remains a cornerstone technology, providing the precision needed to engineer the next generation of electronics and advanced materials. Can detect films thinner than a single nanometer

Used to characterize 2D materials like graphene, where layers are only a few atoms thick. spectroscopic ellipsometry remains a cornerstone technology

Can resolve the individual properties of many stacked layers simultaneously.

Crucial for monitoring the growth of ultra-thin layers (gate oxides, nitrides) in integrated circuits.

data to build a mathematical model of the material's structure. By adjusting parameters like thickness ( ) and optical constants (